| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit capable of ensuring the safety of confidential data within a digital circuit, even when boundary scan is used. SOLUTION: The boundary scan is formed by scan resistors CEL- 11-14. Selectors SEL- 1-4 are interposed between scan resistors CEL- 11-CEL- 14 and internal resistors REG- A1, B1, C1, 11, 12, and 13, respectively. The selectors SEL-1 1-4 switch the connecting state between the scan resistors and the internal resistors, on the basis of a switching control signal S72 from a switching control circuit 72. |
