发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor memory device and a manufacturing method thereof are provided to improve storage capacitance without increasing a height of a capacitor and to prevent a bridge between storage nodes. CONSTITUTION: A plurality of word line patterns(108) are formed on a desired portion of a semiconductor substrate(100). A contact plug is filled between adjacent word line patterns(108). A plurality of bit line patterns(118) are contacted with selected contact plugs. An interlayer dielectric is isolated between contact plugs and between non-selected contact plug and the bit line patterns(118). A plurality of storage node contact plugs(124) are connected with the bit line contact plugs and the non-collected contact plugs. A storage node electrode(126) is formed on the storage node contact plugs. A dielectric film is deposited on the surface of the storage node contact plug(124) and the surface of the storage node electrode(126). A plate electrode is formed on the dielectric film.
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申请公布号 |
KR20020091950(A) |
申请公布日期 |
2002.12.11 |
申请号 |
KR20010030772 |
申请日期 |
2001.06.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE GU |
分类号 |
H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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