| 摘要 |
PROBLEM TO BE SOLVED: To provide a column repair device for a semiconductor memory in which column repair efficiency can be increased in row flexible redundant structure. SOLUTION: This circuit comprises a plurality of column fuse boxes in which unit storage elements are arranged by row lines and column lines intersecting orthogonally, these elements of one or more are constituted corresponding to redundant column lines included in each array for repair of semiconductor memories discriminated with array unit and a column redundant signal for repair is outputted, and an array address inverter in which when self-pair discriminating signal discriminating whether row repair is performed by the array or the other array corresponding to the column fuse boxes and the array address are inputted and inverted and row repair is corresponded by the other array, the address of the corresponded array is encoded and outputted.
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