发明名称 GAS TRAP DEVICE, GENERATED GAS ANALYZER, AND GENERATED GAS ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a gas trap device capable of collecting gas ranging from a low boiling point substance to a high boiling point substance without respect to its boiling point in collection of the generated gas generated by heating an assay sample and allowing easy packing of an adsorbent in a trap tube for easy manufacturing and provide a device and a method for analyzing the generated gas ranging from the low boiling point substance to the high boiling point substance in analysis of the generated gas generated by heating the assay sample. SOLUTION: This gas trap device is provided with the trap tube 31, which has an inlet 31a for gas introduced from the outside and an outlet 31b for discharging the gas to the outside, and silica grain 51 charged into the inside of the trap tube for collecting gas. By means of the silica grain, the generated gas ranging from the low boiling point substance to the high boiling point substance can be efficiently collected over a wide range without respect to its boiling point. The silica grain can be easily packed inside the trap tube, and its desirable grain diameter ranges 40-1000μm.
申请公布号 JP2002350300(A) 申请公布日期 2002.12.04
申请号 JP20010161605 申请日期 2001.05.30
申请人 TDK CORP 发明人 KATO HIDEO;FUKUDA KEIICHI;SHIMAMURA JUNICHI;YONEDA MAYUMI
分类号 G01N25/20;G01N1/00;G01N1/22;G01N5/04;G01N27/62;(IPC1-7):G01N1/00 主分类号 G01N25/20
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