| 摘要 |
PROBLEM TO BE SOLVED: To improve investment efficiency related to a test of a semiconductor integrated circuit. SOLUTION: This test mediating system for the semiconductor integrated circuit is constructed of test provider terminals TS1-TSm, test demander terminals TD1-TDn, and a test mediating device TM connected mutually via a public communication network N. Each of the test provider terminals TS 1-TSm transmits an operation condition of a semiconductor integrated circuit testing device managed by a test provider to the test mediating device TM, while each of the test demander terminals TD1-TDn transmits a test request related to the semiconductor integrated circuit of a test demander to the test mediating device TM. The test mediating device TM sequentially receives operating condition information to store it, and on the basis of the operating condition information, selects the semiconductor circuit testing device complying with the test request to transmit it to the test demander terminals TD1-TDn.
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