发明名称 WAFER CONVEYING APPARATUS
摘要 PROBLEM TO BE SOLVED: To uniformly hold a temperature distribution in a surface of a wafer 26 and to convey the wafer in a wafer conveying apparatus for conveying the wafer 26. SOLUTION: The wafer conveying apparatus comprises a thermostatic chamber 1 with a temperature regulating function of a temperature control plate 2 for housing the wafer 26 on a moving mechanism 21 which runs on a track 22. The apparatus maintains the temperature of the received wafer 26 with a resist 27, conveys the wafer 26 and holds the temperature distribution in the surface of the wafer 26 uniform without being influenced by an environmental temperature on the way of a conveying route.
申请公布号 JP2002343847(A) 申请公布日期 2002.11.29
申请号 JP20010149013 申请日期 2001.05.18
申请人 NEC YAMAGUCHI LTD 发明人 KIMURA RYOSHI
分类号 B61D27/00;B65G49/00;B65G49/07;H01L21/027;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B61D27/00
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