发明名称 |
FLASH MEMORY AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To improve deletion speed by a comparatively simple method modifying a mask shape for resist patterning during a manufacturing process. SOLUTION: The memory cell 101 of a flash memory is provided with a p type substrate 103 having an n type source 102 area and a drain 3 area separated and formed so as to form a channel area on a main face and a gate electrode part 108 comprising a first polysilicon layer 105 formed through a silicon oxidation film 104 on a channel area and a second polysilicon layer 107 formed through an ONO film 106 on a floating gate. The side of the area side of the source 102 of the gate electrode part 108 on the channel area is arc-shaped protruded to the area side of the drain.
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申请公布号 |
JP2002324859(A) |
申请公布日期 |
2002.11.08 |
申请号 |
JP20010129181 |
申请日期 |
2001.04.26 |
申请人 |
NEC KANSAI LTD |
发明人 |
SAWADA KAZUHISA |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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