发明名称 FLASH MEMORY AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve deletion speed by a comparatively simple method modifying a mask shape for resist patterning during a manufacturing process. SOLUTION: The memory cell 101 of a flash memory is provided with a p type substrate 103 having an n type source 102 area and a drain 3 area separated and formed so as to form a channel area on a main face and a gate electrode part 108 comprising a first polysilicon layer 105 formed through a silicon oxidation film 104 on a channel area and a second polysilicon layer 107 formed through an ONO film 106 on a floating gate. The side of the area side of the source 102 of the gate electrode part 108 on the channel area is arc-shaped protruded to the area side of the drain.
申请公布号 JP2002324859(A) 申请公布日期 2002.11.08
申请号 JP20010129181 申请日期 2001.04.26
申请人 NEC KANSAI LTD 发明人 SAWADA KAZUHISA
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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