发明名称 Lithographic apparatus
摘要 A lithographic projection apparatus comprising a first radiation system (1) for providing a first projection beam of radiation (4), a second radiation system (11) for providing a second projection beam of radiation (14), a support structure for supporting a first patterning means (2) and a second patterning means (12), the first patterning means serving to pattern the first projection beam according to a first pattern and the second patterning means serving to pattern the second projection beam according to a first pattern; a substrate table for holding a substrate (25), a projection system (20) for combining the first (24) and second (224) patterned beams and projecting the combined beam (2224) onto a target portion of the substrate. <IMAGE>
申请公布号 EP1255162(A1) 申请公布日期 2002.11.06
申请号 EP20010304075 申请日期 2001.05.04
申请人 ASML NETHERLANDS B.V. 发明人
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
代理机构 代理人
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