| 摘要 |
<p>A semiconductor test system capable of generating a sequence with a high time precision by using a general-purpose operating system. This semiconductor test system includes tester hardware for supplying power and a test pattern to a device to be tested, a host computer operating on a general-purpose operating system, configuration software for calculating configuration data and timing data in accordance with a test program, a device driver for supplying a power trigger and a signal trigger to the tester hardware, and a hardware timer for generating an interrupt signal. The device driver, upon reception of the interrupt signal, starts the test pattern or turns the power supply off.</p> |
