| 摘要 |
PURPOSE: To make a space on a tested chip serve as an occupied space for a contact corresponding to the tested chip to preclude the contact from being protruded out of a space on another tested chip. CONSTITUTION: This assembly is provided with a lateral-directional parallel contact group 121 arrayed with the first plural vertical type contacts 112, and a vertical-directional parallel contact group 122 arrayed with the second plural vertical type contacts 212. The lateral-directional parallel contact group 121 and the vertical-directional parallel contact group 122 occupy the different deformed spaces on a plane area of the tested chips to be converged within the plane area of the tested chips. |
