发明名称 Apparatus and method for plasma etching
摘要 In a chamber, there are provided a sample stage on which a semiconductor substrate is placed, a gas inlet port for introducing etching gas, and a gas outlet port for exhausting the gas. A slide valve having a valve element which rotates relative to a valve seat is provided between the sample stage and the gas outlet port to adjust the amount of gas exhausted from the gas outlet port with the rotation of the valve element. A spiral coil for generating a high-frequency induction field and thereby changing the etching gas into a plasma is rotatably provided over the chamber. Rotative driving means rotates the spiral coil in response to the rotation of the valve element of the slide valve such that the higher-voltage region of the spiral coil approximately coincides with the exhaust-side region of the slide valve.
申请公布号 US2002134509(A1) 申请公布日期 2002.09.26
申请号 US20020067966 申请日期 2002.02.08
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 OHKUNI MITSUHIRO
分类号 H01J37/32;H01L21/311;H01L21/3213;(IPC1-7):C23F1/00 主分类号 H01J37/32
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