发明名称 |
Test piece analyzing apparatus |
摘要 |
A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.
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申请公布号 |
US6455865(B2) |
申请公布日期 |
2002.09.24 |
申请号 |
US20010845895 |
申请日期 |
2001.04.30 |
申请人 |
KYOTO DAIICHI KAGAKU CO., LTD. |
发明人 |
EGAWA KOUJI |
分类号 |
G01N35/04;G01N1/28;G01N35/00;(IPC1-7):G01N21/86 |
主分类号 |
G01N35/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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