| 摘要 |
PROBLEM TO BE SOLVED: To dispense with an expensive IC tester, and to easily, simply and quickly degug a test program prepared already. SOLUTION: Impressed waveforms are generated successively in a waveform generator 1 under control by the test program finished in its preparation, the each impressed waveform, an expected waveform generated as a pair of the impressed waveform, and an response waveform from an IC 4 with respect to the impressed waveform are collected collectively and waveform-analyzed every impression onto the IC 4, an editor function provided in the generator 1 is used when necessity of the debugging is recognized, and the preparation- finished program is debugged thereby, while displayed visibly on a display 3 at the same time. |
