发明名称 |
METHOD FOR FABRICATING TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a transistor is provided to form an impurity region shallower than a conventional impurity region using boron ions and increase an activation degree of ions implanted through a drive-in process beyond solid solubility by using indium ions as LDD implantation ions and performing a drive-in process using laser. CONSTITUTION: A gate electrode(17) is formed on an n-type semiconductor substrate(11) by interposing a gate insulation layer(15). Low density indium ions are implanted into the surface of the semiconductor substrate at both sides of the gate electrode. A drive-in process using laser is performed to form the first source/drain impurity region(20). A buffer layer and the first insulation layer spacer are formed on the sidewall of the gate electrode. High density p-type impurity ions are implanted into the surface of the semiconductor substrate at both sides of the gate electrode including the first insulation layer spacer to form the second source/drain impurity region.
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申请公布号 |
KR100354870(B1) |
申请公布日期 |
2002.09.18 |
申请号 |
KR20000083799 |
申请日期 |
2000.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYUNG SIK;SA, SEUNG HOON |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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主权项 |
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地址 |
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