发明名称 METHOD FOR FABRICATING TRANSISTOR
摘要 PURPOSE: A method for fabricating a transistor is provided to form an impurity region shallower than a conventional impurity region using boron ions and increase an activation degree of ions implanted through a drive-in process beyond solid solubility by using indium ions as LDD implantation ions and performing a drive-in process using laser. CONSTITUTION: A gate electrode(17) is formed on an n-type semiconductor substrate(11) by interposing a gate insulation layer(15). Low density indium ions are implanted into the surface of the semiconductor substrate at both sides of the gate electrode. A drive-in process using laser is performed to form the first source/drain impurity region(20). A buffer layer and the first insulation layer spacer are formed on the sidewall of the gate electrode. High density p-type impurity ions are implanted into the surface of the semiconductor substrate at both sides of the gate electrode including the first insulation layer spacer to form the second source/drain impurity region.
申请公布号 KR100354870(B1) 申请公布日期 2002.09.18
申请号 KR20000083799 申请日期 2000.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYUNG SIK;SA, SEUNG HOON
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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