发明名称 Menetelmä ja järjestelmä mittaamiseksi
摘要 The invention relates to a method and system for measuring a material. In particular, the invention relates to a method and system for reliably effecting a measurement by imaging a material to be measured and a measuring process, by measuring the material to be measured, as well as by combining an image of the material to be measured and the measuring process, as well as a measuring result, for electronic measuring data. According to the invention, the electronic measuring data is stored and transmitted to the accessibility of at least one of the parties involved in the process. <IMAGE>
申请公布号 FI20010498(A) 申请公布日期 2002.09.14
申请号 FI20010000498 申请日期 2001.03.13
申请人 TAMTRON OY, 发明人 ASIKAINEN,PENTTI
分类号 G01B11/00;G01D5/39;G01G19/00;G01G19/02;G01G19/414;(IPC1-7):G01B11/00 主分类号 G01B11/00
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