发明名称 |
METHOD FOR AMENDING EMULSION MASK PATTERN DEFECT |
摘要 |
<p>PROBLEM TO BE SOLVED: To enable defect of a light shielding pattern to be efficiently amended by an amending device of simple structure without giving thermal damage to a light translucent emulsion film. SOLUTION: In the emulsion mask in which a periodic pattern constituted by repeatedly arranging light shielding patterns P of a prescribed shape is formed on a light translucent emulsion film E coated on a transparent glass plate G, when a defective part K which is generated in the light shielding pattern P and partially transmits light is amended, a light shielding amending liquid containing a UV curing resin is applied onto a defective pattern in which the defective part K is generated beyond a range covering the defective part K, the applied liquid is irradiated with a laser beam of a UV region (third or fourth higher harmonic wave of YAG laser) to cure the amending liquid and to form a coating film. Then an overflowed part of the coating film beyond a pattern form is further irradiated with the same laser beam to cause photolysis and to be removed.</p> |
申请公布号 |
JP2002251002(A) |
申请公布日期 |
2002.09.06 |
申请号 |
JP20010048146 |
申请日期 |
2001.02.23 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
UEHARA NOBORU;WATANABE SUIBUN;SUZUKI KENSAKU |
分类号 |
G03F1/72;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/72 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|