发明名称 METHOD FOR AMENDING EMULSION MASK PATTERN DEFECT
摘要 <p>PROBLEM TO BE SOLVED: To enable defect of a light shielding pattern to be efficiently amended by an amending device of simple structure without giving thermal damage to a light translucent emulsion film. SOLUTION: In the emulsion mask in which a periodic pattern constituted by repeatedly arranging light shielding patterns P of a prescribed shape is formed on a light translucent emulsion film E coated on a transparent glass plate G, when a defective part K which is generated in the light shielding pattern P and partially transmits light is amended, a light shielding amending liquid containing a UV curing resin is applied onto a defective pattern in which the defective part K is generated beyond a range covering the defective part K, the applied liquid is irradiated with a laser beam of a UV region (third or fourth higher harmonic wave of YAG laser) to cure the amending liquid and to form a coating film. Then an overflowed part of the coating film beyond a pattern form is further irradiated with the same laser beam to cause photolysis and to be removed.</p>
申请公布号 JP2002251002(A) 申请公布日期 2002.09.06
申请号 JP20010048146 申请日期 2001.02.23
申请人 DAINIPPON PRINTING CO LTD 发明人 UEHARA NOBORU;WATANABE SUIBUN;SUZUKI KENSAKU
分类号 G03F1/72;(IPC1-7):G03F1/08 主分类号 G03F1/72
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