| 摘要 |
PURPOSE: To provide an automatic handler that allows a terminal of an IC to surely press against a contact element, applies an adequate contact force thereto and readily adjusts the contact force to readily correspond to various kinds of ICs. CONSTITUTION: There is disclosed the automatic handler that tests an IC such that the terminal of the IC is pressed against a contact element of an IC socket by transporting the IC by using a transporting means. The automatic handler comprises a dumper having a sealed space therein which is interposed between the transporting means and the IC, a manometer for measuring the inner pressure of the sealed space and a control means for controlling the stop position of the IC in the transporting such that the measured value of the manometer is to be a prescribed value.
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