发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve coupling between a floating gate electrode and a control gate electrode of a non-volatile semiconductor memory device. SOLUTION: The non-volatile semiconductor memory device has a semiconductor substrate 1 with a major surface, a floating gate electrode 8 having a doped polysilicon film 6 formed on the major surface via a thermal oxide film 4 and a doped polysilicon film 7, which is laminated on the doped polysilicon film 6 and has a raised wall 7a, an insulation film 9, formed to cover the doped polysilicon film 7 and a control gate electrode 35 formed on the insulation film 9.
申请公布号 JP2002246485(A) 申请公布日期 2002.08.30
申请号 JP20010035590 申请日期 2001.02.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHIMIZU HIDE
分类号 H01L21/8247;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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