发明名称 |
METHOD FOR DETERMINING PROPERTIES OF OPTICAL DEVICE AND INSPECTION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for determining elements or the like of the Jones matrix of an optical device without requiring an interferometer. SOLUTION: This method comprises a process for generating an incoming light beam; a process for dividing the incoming light beam to a first light beam and a second light beam; a process for making the first light beam having two mutually delayed parts into a given initial polarized light and connecting it to the optical device to be tested; a process for advancing the second light beam to a route different from the first light beam; a process for superposing the first light beam to the second light beam and performing an interference between the first and second light beams in the superimposed light beam; a process for separating the superimposed light beam to depending third light beam and fourth light beam; a process for detecting the powers of the third and fourth light beams as the function of frequency when synchronizing the frequency of the incoming light beam over a given frequency range; and a process for deriving the properties of the optical device to be tested from the frequency dependency of the detected powers.
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申请公布号 |
JP2002243585(A) |
申请公布日期 |
2002.08.28 |
申请号 |
JP20010349780 |
申请日期 |
2001.11.15 |
申请人 |
AGILENT TECHNOL INC |
发明人 |
ROSENFELDT HARALD;WIGGEREN GREG VAN;BANEY DOUGLAS |
分类号 |
G01M11/00;G01M11/02;(IPC1-7):G01M11/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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