发明名称 Semiconductor device with copper wiring and its manufacture method
摘要 The method of manufacturing a semiconductor device includes the steps of forming copper wiring; reducing an oxide film on the surface of the copper wiring by heating the copper wiring to a temperature in a range of 250° C.-450° C. under reductive gas or by treating the copper wiring in plasma of reductive gas; and then forming a film of a material not containing oxygen on the copper wiring without exposing the copper wiring to external atmosphere, and can provide a semiconductor device with good copper wiring.
申请公布号 US6440844(B1) 申请公布日期 2002.08.27
申请号 US19980111799 申请日期 1998.07.08
申请人 FUJITSU LIMITED 发明人 TAKAGI HIDEO;IZUMI KIYOSHI;FUTO WATARU;OTSUKA SATOSHI;UJI SHIGETAKA;HOSHINO MASATAKA;SATOH YUKIHIRO;ENDO KOJI;OHTA YUZURU;MISAWA NOBUHIRO
分类号 H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/3205
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