发明名称 |
Testing system and testing method for structure |
摘要 |
The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated. The actuator and the shaking table are driven so as to make this calculated motion.
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申请公布号 |
US2002116136(A1) |
申请公布日期 |
2002.08.22 |
申请号 |
US20020106537 |
申请日期 |
2002.03.27 |
申请人 |
HITACHI, LTD. |
发明人 |
YAMAGISHI WATARU;HORIUCHI TOSHIHIKO;INOUE MASAHIKO;UMEKITA KAZUHIRO;MOMOI YASUYUKI |
分类号 |
G01M7/02;G01M7/06;G01V1/00;(IPC1-7):G01L1/00;G01L3/00;G01L5/00;G06F19/00 |
主分类号 |
G01M7/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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