发明名称 Testing system and testing method for structure
摘要 The present invention discloses a testing system and a testing method for a structure which tests a structure made of a test piece structure and a numerical model virtually connected to the structure. A simulated structure including a frame, an actuator and a reaction force measuring device is mounted on a foundation on which a shaking table is also mounted. Only the test piece structure is mounted on the shaking table. The motion of the shaking table 5 which is generated at the time of shaking the test piece structure using the shaking table and the actuator is measured by a shaking table motion measuring device, while the reaction force generated by the test piece structure is measured by a reaction force measuring device. Using these measured values and the numerical model stored in a digital computer, the motion of the test piece structure after a predetermined period for the motion of the simulated structure is calculated. The actuator and the shaking table are driven so as to make this calculated motion.
申请公布号 US2002116136(A1) 申请公布日期 2002.08.22
申请号 US20020106537 申请日期 2002.03.27
申请人 HITACHI, LTD. 发明人 YAMAGISHI WATARU;HORIUCHI TOSHIHIKO;INOUE MASAHIKO;UMEKITA KAZUHIRO;MOMOI YASUYUKI
分类号 G01M7/02;G01M7/06;G01V1/00;(IPC1-7):G01L1/00;G01L3/00;G01L5/00;G06F19/00 主分类号 G01M7/02
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