发明名称 Redundant circuit and method for replacing defective memory cells in a memory device
摘要 A memory device having redundancy is disclosed. The memory device includes an array of memory cells organized into rows and columns of memory cells, each row of memory cells including a plurality of addressable memory cells and redundant memory cells, the array of memory cells including row lines and column lines, each row line being coupled to memory cells in a distinct row of memory cells, each column line being coupled to memory cells in a distinct column of memory cells, and column input/output lines. The memory device further includes a redundancy circuitry for selectively coupling column lines to column input/output lines of the array of memory cells and selectively decoupling at least one column line from the column input/output lines, based upon an address value received by the memory device during a memory access operation.
申请公布号 US2002113251(A1) 申请公布日期 2002.08.22
申请号 US20010790370 申请日期 2001.02.21
申请人 STMICROELECTRONICS, INC. 发明人 BRADY JAMES
分类号 G11C7/00;G11C8/10;G11C29/00;H01L31/109;(IPC1-7):H01L31/109 主分类号 G11C7/00
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