发明名称 Chemical vapor deposition method for amorphous silicon and resulting film
摘要 Method of depositing a layer of amorphous silicon film on a substrate at a very fast deposition rate while maintaining superior film quality. A plasma volume in a process chamber is defined. A total flow rate of a mixture of gases introduced into the chamber is also defined. The total flow rate is the sum of the flow rates of the respective gases in the mixture. Next, a process parameter that includes the plasma volume and total flow rate is defined. The process parameter is then maintained in a first predetermined relationship with a predetermined value during the deposition of the amorphous silicon film.
申请公布号 US6436488(B1) 申请公布日期 2002.08.20
申请号 US20000591815 申请日期 2000.06.12
申请人 AGILENT TECHNOLOGIES, INC. 发明人 THEIL JEREMY A;KOOI GERRIT J;VARGHESE RON P
分类号 C23C16/24;C23C16/44;C23C16/50;C23C16/52;H01L21/205;H01L31/0376;H01L31/04;H01L31/20;(IPC1-7):H05H1/24 主分类号 C23C16/24
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