| 摘要 |
A test configuration for a programmable logic device (PLD) measures and stores the relative signal-propagation delays of a pair of signal paths extending into the PLD from PLD input pins. The PLD is configured to instantiate a ring oscillator that selectively includes either signal path in the ring. The oscillator exhibits a first oscillation period when the oscillator includes the first signal path, and exhibits a second oscillation period when the oscillator includes the second signal path. The difference between the first and second periods provides a measure of the difference between the signal propagation delays of the two paths of interest.
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