发明名称 APPARATUS FOR TESTING PERFORMANCE OF DEGAUSSING COIL AND METHOD THEREOF
摘要 PURPOSE: An apparatus for testing a performance of a degaussing coil and a method thereof are provided, which performs a component characteristics inspection and an overall characteristics inspection of a degaussing which a PTC(Positive Temperature Coefficient) or an NTC(Negative Temperature Coefficient) has from a television where the degaussing coil is installed. CONSTITUTION: An electric field sensing part(31) senses an induced electromotive force generated from a degaussing coil. A signal processing part(33) receives the induced electromotive force sensed by the electric field sensing part and performs a processing to digitalize the induced electromotive force. An AD(Analog/Digital) converter part(35) converts an analog signal processed by the signal processing part into a digital signal. And a performance inspection part(37) inspects the performance of the degaussing coil by analyzing a pattern of the digital signal. The electric field sensing part includes a sensing coil using an inductive material. And the signal processing part includes an amplifier(33a) amplifying the induced electromotive force and a signal distribution part(33b) alternating a signal being output from the amplifier.
申请公布号 KR20020064843(A) 申请公布日期 2002.08.10
申请号 KR20010005284 申请日期 2001.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, GAP SU;OH, HAN JIN;PARK, JAE GEUN
分类号 G01R31/24;(IPC1-7):G01R31/24 主分类号 G01R31/24
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