发明名称 |
APPARATUS FOR TESTING PERFORMANCE OF DEGAUSSING COIL AND METHOD THEREOF |
摘要 |
PURPOSE: An apparatus for testing a performance of a degaussing coil and a method thereof are provided, which performs a component characteristics inspection and an overall characteristics inspection of a degaussing which a PTC(Positive Temperature Coefficient) or an NTC(Negative Temperature Coefficient) has from a television where the degaussing coil is installed. CONSTITUTION: An electric field sensing part(31) senses an induced electromotive force generated from a degaussing coil. A signal processing part(33) receives the induced electromotive force sensed by the electric field sensing part and performs a processing to digitalize the induced electromotive force. An AD(Analog/Digital) converter part(35) converts an analog signal processed by the signal processing part into a digital signal. And a performance inspection part(37) inspects the performance of the degaussing coil by analyzing a pattern of the digital signal. The electric field sensing part includes a sensing coil using an inductive material. And the signal processing part includes an amplifier(33a) amplifying the induced electromotive force and a signal distribution part(33b) alternating a signal being output from the amplifier.
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申请公布号 |
KR20020064843(A) |
申请公布日期 |
2002.08.10 |
申请号 |
KR20010005284 |
申请日期 |
2001.02.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, GAP SU;OH, HAN JIN;PARK, JAE GEUN |
分类号 |
G01R31/24;(IPC1-7):G01R31/24 |
主分类号 |
G01R31/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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