发明名称 SURFACE INSPECTING EQUIPMENT AND SURFACE CLOSE INSPECTING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a surface inspecting equipment and a surface inspection method, wherein a surface of an object to be inspected on which a mirror reflection region and an irregular reflection region coexist can be efficiently inspected or closely inspected. SOLUTION: The surface inspecting equipment 10 to inspect the surface of the object 1 to be inspected on which the mirror reflection region 3 and the irregular reflection region 2 coexist includes an optical system 10a to irradiate a beam light to the object 1 to be inspected, a screen 19 which is arranged in a regular reflective direction of the irradiated beam light and receives the light reflected by the object 1 to be inspected, a first light-gathering optical system 21 which gathers a light reflected by the screen 19, and a first optical detector 22 which receives the light gathered. The beam light is designed to scan the surface of the object 1 to be inspected, and a position detector 15 is provided to detect a relative position between the object 1 to be inspected and scanned as above and the beam light.
申请公布号 JP2002221492(A) 申请公布日期 2002.08.09
申请号 JP20010017648 申请日期 2001.01.25
申请人 SUMITOMO OSAKA CEMENT CO LTD 发明人 TAKEI TOSHIJI
分类号 G01N21/84;B07C3/14;G06K9/20;G06T1/00;(IPC1-7):G01N21/84 主分类号 G01N21/84
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