发明名称 DISSOLVING METHOD OF SILICON LAYER FORMED ON SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To provide a dissolving method of a silicon layer formed on a silicon wafer. SOLUTION: It is possible to dissolve selectively only the silicon layer formed on the silicon wafer by using an aqueous solution of tetraalkyl ammonium hydrooxide and to reuse the silicon wafer. By analyzing a slight amount of metal constituent contained in the meltage, it is possible to analyze the slight amount of metal contained in only the silicon layer.
申请公布号 JP2002217163(A) 申请公布日期 2002.08.02
申请号 JP20010008001 申请日期 2001.01.16
申请人 MITSUI CHEMICAL ANALYSIS & CONSULTING SERVICE INC 发明人 YONESHIGE YOSHIHIRO;NAKADA KOTA;MIYAZAKI TETSUYA
分类号 C01B33/02;H01L21/306;H01L21/66;(IPC1-7):H01L21/306 主分类号 C01B33/02
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