发明名称 |
DISSOLVING METHOD OF SILICON LAYER FORMED ON SILICON WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a dissolving method of a silicon layer formed on a silicon wafer. SOLUTION: It is possible to dissolve selectively only the silicon layer formed on the silicon wafer by using an aqueous solution of tetraalkyl ammonium hydrooxide and to reuse the silicon wafer. By analyzing a slight amount of metal constituent contained in the meltage, it is possible to analyze the slight amount of metal contained in only the silicon layer.
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申请公布号 |
JP2002217163(A) |
申请公布日期 |
2002.08.02 |
申请号 |
JP20010008001 |
申请日期 |
2001.01.16 |
申请人 |
MITSUI CHEMICAL ANALYSIS & CONSULTING SERVICE INC |
发明人 |
YONESHIGE YOSHIHIRO;NAKADA KOTA;MIYAZAKI TETSUYA |
分类号 |
C01B33/02;H01L21/306;H01L21/66;(IPC1-7):H01L21/306 |
主分类号 |
C01B33/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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