发明名称 Method for heating a wafer
摘要 A method is provided for preparing a substrate for processing in a chamber that has a substrate receiving portion. The substrate is positioned within the chamber in a location not on the substrate receiving portion. A gaseous flow is provided to the chamber, from which a plasma is struck to heat the substrate. After the substrate has been heated, it is moved to the substrate receiving portion for processing. <IMAGE>
申请公布号 EP1227171(A1) 申请公布日期 2002.07.31
申请号 EP20010124617 申请日期 2001.10.15
申请人 APPLIED MATERIALS, INC. 发明人 ROSSMAN, KENT
分类号 C23C16/52;C23C14/02;C23C16/02;H01L21/02;H01L21/205;H01L21/302;H01L21/683 主分类号 C23C16/52
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