发明名称 VOLTAGE DROP ANALYZING SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve the accuracy in analyzing the voltage drop of a semicon ductor integrated circuit. SOLUTION: The consumed current of one megacell 60 is divided into plural constant-current sources 64, and these plural constant-current sources 64 are equally allocated to a power source wiring 62 in the megacell to modelize the megacell 60. The modelized megacell 60 is applied as the megacell in the semiconductor integrated circuit, and then the voltage drop of the semiconductor integrated circuit is analyzed.
申请公布号 JP2002197139(A) 申请公布日期 2002.07.12
申请号 JP20000395395 申请日期 2000.12.26
申请人 TOSHIBA CORP 发明人 HAYASHI SACHIO
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
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