发明名称 MEMORY MODULE AND MEMORY COMPONENT BUILT-IN SELF TEST
摘要 A memory component with built-in self test includes a memory array. An input/output interface is coupled to the memory array and has a loopback. A controller is provided to transmit memory array test data to the memory array to store the memory array test data, and to read the memory array test data from the memory array. A compare register is also provided to compare the memory array test data transmitted to the memory array with the memory array test data read from the memory array.
申请公布号 WO0225957(A3) 申请公布日期 2002.07.11
申请号 WO2001US28774 申请日期 2001.09.14
申请人 INTEL CORPORATION;HALBERT, JOHN;BONELLA, RANDY 发明人 HALBERT, JOHN;BONELLA, RANDY
分类号 G11C29/14 主分类号 G11C29/14
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