发明名称 Method and circuit for determining sense amplifier sensitivity
摘要 A dynamic random access memory (DRAM) includes a bit line pair, including a first bit line and a second bit line. Memory cells and a sense amplifier are coupled to the bit lines. A first characterization cell is coupled between the first bit line and a first reference supply line. The first characterization cell includes a capacitor. Similarly, a second characterization cell is coupled between the first bit line and the first reference supply line. The second characterization cell also includes a capacitor but preferably with a different capacitance. In the preferred embodiment, similar characterization cells are coupled to the second bit line.
申请公布号 US6418044(B1) 申请公布日期 2002.07.09
申请号 US20000752568 申请日期 2000.12.28
申请人 STMICROELECTRONICS, INC. 发明人 LAURENT DUANE GILES
分类号 G01R31/28;G01R31/319;G11C7/06;G11C11/401;G11C11/409;G11C11/4091;G11C29/12;(IPC1-7):G11C7/00 主分类号 G01R31/28
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