Electron microscope equipped with electron biprism

摘要

An electron microscope equipped with an electron biprism is provided with second and third objective lenses placed between a sample and the electron biprism such that the sample is not affected by the magnetic fields produced by the objective lenses. The magnification of a TEM image of the sample at the focal point H is controllably varied by appropriately controlling the excitations of the objective lenses The spacing of carrier fringes is adjusted by controllably varying the voltage applied to a line electrode of the biprism.