| 摘要 |
A semiconductor integrated circuit device includes a logic LSI formed on a semiconductor substrate and divided into a plurality of function blocks, each of which can receive a test data directly from an external and can output a test result directly to the external. The whole of the logic LSI is divided in accordance with the Rent rule into the plurality of function blocks which have a constant size and which are located in a predetermined locating manner. A test dedicated bus is laid out on the semiconductor substrate to pass through all the plurality of function blocks for transferring the test data and the test result of each function block.
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