发明名称 Method and system for integrating shallow trench and deep trench isolation structures in a semiconductor device
摘要 A semiconductor device and a method for constructing a semiconductor device is disclosed. A deep trench isolation structure (108) is formed proximate a surface of a semiconductor substrate (106). A deep trench plug (122) layer is deposited within the deep trench isolation structure (108). A shallow trench isolation structure (130) is formed where the deep trench isolation structure (108) meets the surface of the semiconductor substrate (106). A shallow trench plug layer (133) is deposited within the shallow trench isolation structure (130).
申请公布号 US2002081809(A1) 申请公布日期 2002.06.27
申请号 US20010024091 申请日期 2001.12.14
申请人 PINTO ANGELO;ROMANI RICARDO A.;HOWARD GREGORY E. 发明人 PINTO ANGELO;ROMANI RICARDO A.;HOWARD GREGORY E.
分类号 H01L21/762;(IPC1-7):H01L21/336;H01L21/76 主分类号 H01L21/762
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