发明名称 DUAL TRENCH ISOLATION FOR A PHASE-CHANGE MEMORY CELL AND METHOD OF MAKING SAME
摘要 The invention relates to a phase-change memory device. The device includes a double-trench isolation structure around the diode stack that communicates to the lower electrode. The present invention also relates to a method of making a phase-change memory device. The method includes forming two orthogonal and intersecting isolation trenches around a memory cell structure diode stack.
申请公布号 US2002081807(A1) 申请公布日期 2002.06.27
申请号 US20000745322 申请日期 2000.12.21
申请人 XU DANIEL 发明人 XU DANIEL
分类号 H01L21/762;H01L27/24;(IPC1-7):H01L21/336 主分类号 H01L21/762
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