| 摘要 |
PROBLEM TO BE SOLVED: To provide an EMC test estimation system capable of specifying each characteristic deterioration factor in an EMC test site, and to provide a method for improving the EMC test site by use of a result obtained by using the EMC test estimation system. SOLUTION: This system has the EMC test site such as an open site, an electric wave darkroom (5-face electric wave absorbers, 6-face electric wave absorbers) or the like; a transmitter set in apposition of a sample inside the EMC test site; a receiver set in a position for measuring an interference wave generated by the sample; and a signal processor controlling the transmitter and the receiver and processing a signal from the receiver.
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