发明名称 Composition for film formation, method of film formation, and insulating film
摘要 A polyorganosiloxane-based composition for film formation which gives a film having low dielectric constant and high modulus of elasticity and useful as an interlayer insulating film in semiconductor devices and the like. The composition for film formation comprises: (A) a product of hydrolysis and condensation obtained by hydrolyzing and condensing, in the presence of an alkali catalyst, at least one member selected from the group consisting of compounds (1) represented by RaSi(OR1)4-a (wherein R represents hydrogen, fluorine, or a monovalent organic group; R1 represents a monovalent organic group; and a Is an integer of 1 or 2), compounds (2) represented by Si(OR2)4 (wherein R2 represents a monovalent organic group), and compounds (3) represented by R3b(R4O)3-bSi-(R7)d-Si(OR5)3-cR6c [wherein R3 to R6 may be the same or different and each represent a monovalent organic group; b and c may be the same or different and each are an integer of 0 to 2; R7 represents oxygen, phenylene, or a group represented by -(CH2)n-, wherein n is an integer of 1 to 6; and d is 0 or 1]; and (B) a product of hydrolysis and condensation obtained by hydrolyzing and condensing, in the presence of an acid catalyst, at least one member selected from the group consisting of the compounds (1), (2), and (3).
申请公布号 US6410150(B1) 申请公布日期 2002.06.25
申请号 US20000669859 申请日期 2000.09.27
申请人 JSR CORPORATION 发明人 KUROSAWA TAKAHIKO;HAYASHI EIJI;YOUNGSOON SEO;KONNO KEIJI;SHIOTA ATSUSHI;YAMADA KINJI
分类号 C08L83/04;C09D183/04;C09D183/14;H01L21/312;(IPC1-7):B32B9/04 主分类号 C08L83/04
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