发明名称 |
TOTAL REFLECTION MEASURING APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a total reflection measuring apparatus, capable of obtaining a total reflection by easily and accurately changing the incident angle using one apparatus. SOLUTION: The total reflection measuring apparatus 122 which obtains a totally reflected beam 120 converges an incident beam 118 at an incident angle of critical angle or larger to an abutting surface 131 of a total reflection prism with a sample to be measured. The apparatus 122 comprises an incident angle changing means 164, capable of changing the incident angle of the beam 118 to the surface 131 of a total reflection prism 110 with the sample 112 within a range of the angle capable of measuring total reflection. The apparatus 122 obtains the beam 120 by changing the incident angle of the beam 118 by the means 164.</p> |
申请公布号 |
JP2002174591(A) |
申请公布日期 |
2002.06.21 |
申请号 |
JP20000373127 |
申请日期 |
2000.12.07 |
申请人 |
JASCO CORP |
发明人 |
NAGOSHI TOSHIYUKI;CHISAKA TAKAMASA |
分类号 |
G01B11/06;G01N21/01;G01N21/27;G01N21/35;G01N21/552;(IPC1-7):G01N21/27 |
主分类号 |
G01B11/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|