发明名称 TOTAL REFLECTION MEASURING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a total reflection measuring apparatus, capable of obtaining a total reflection by easily and accurately changing the incident angle using one apparatus. SOLUTION: The total reflection measuring apparatus 122 which obtains a totally reflected beam 120 converges an incident beam 118 at an incident angle of critical angle or larger to an abutting surface 131 of a total reflection prism with a sample to be measured. The apparatus 122 comprises an incident angle changing means 164, capable of changing the incident angle of the beam 118 to the surface 131 of a total reflection prism 110 with the sample 112 within a range of the angle capable of measuring total reflection. The apparatus 122 obtains the beam 120 by changing the incident angle of the beam 118 by the means 164.</p>
申请公布号 JP2002174591(A) 申请公布日期 2002.06.21
申请号 JP20000373127 申请日期 2000.12.07
申请人 JASCO CORP 发明人 NAGOSHI TOSHIYUKI;CHISAKA TAKAMASA
分类号 G01B11/06;G01N21/01;G01N21/27;G01N21/35;G01N21/552;(IPC1-7):G01N21/27 主分类号 G01B11/06
代理机构 代理人
主权项
地址