| 摘要 |
Method has the following steps: short-term incomplete discharge of the capacitor to a residual voltage, storage of the residual voltage value, further discharge of the capacitance to a discharged voltage, measurement of the difference between residual and discharged voltage, emission of a fault signal if the discharge voltage is the same as or greater than the residual voltage and emission of a fault-free signal if the discharged voltage is below the residual voltage. An Independent claim is made for a circuit for testing the output of an electrical component (1) to a high impedance supply voltage. The circuit comprises a sample and hold circuit (9), a constant current source (I1) for discharge of the capacity (C1) of the test component and differential voltage measurement devices (3, 7).
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