| 发明名称 |
PRELIMINARY TREATMENT METHOD AND DEVICE FOR SAMPLE FOR ANALYZING TRACE ELEMENT IN METAL |
| 摘要 |
PROBLEM TO BE SOLVED: To provide a preliminary treatment method and its device for a sample for analyzing a trace element in metal capable of simply and rapidly analyzing the trace element in metal as compared with a conventional one and of analyzing it with high precision. SOLUTION: Surface contamination is removed by exposing an analyzed sample in an atmosphere of 10 Pa or less.
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| 申请公布号 |
JP2002168741(A) |
申请公布日期 |
2002.06.14 |
| 申请号 |
JP20000362030 |
申请日期 |
2000.11.29 |
| 申请人 |
KAWASAKI STEEL CORP;ABIKO KENJI;ULVAC FUAI KK;NIPPON ANALYST KK |
发明人 |
YASUHARA HISAO;SHIMURA MAKOTO;ABIKO KENJI;IWAI HIDEO;ARAIDA TAKASHI |
| 分类号 |
G01N1/34;G01N1/00;G01N1/32;G01N33/20;(IPC1-7):G01N1/34 |
主分类号 |
G01N1/34 |
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