| 摘要 |
In an IC testing apparatus which executes a function test and a DC test, a resistor having a high resistance is connected to the output side of a DC tester such that the connection of the resistor allows a function test to operate normally if the DC tester is left connected to the function tester, thus allowing the DC test to be interrupted into the execution of the function test to enable a concurrent execution of the function test and the DC test. As a result, the time required to change switches in the DC tester, for example, can be executed during the function test, thus preventing the time interval required to change the switches from increasing the time interval required for the test, thereby reducing the testing time interval.
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