Method for comparing package EMI performance at multiple clock speeds

摘要

A method for characterizing EMI performance of an integrated circuit (IC) device provides a testing methodology that considers the IC's performance at a number of operating speeds. The IC is operated at a plurality of operating, or core, speeds and EMI emissions data are measured at a number of frequencies for each such core speed. An EMI characterization of the device is then formed using these measured EMI emissions data; the resulting EMI characterization is based on the emissions data of the device at more than a single operating speed and thus provides a meaningful measure of its EMI performance.