| 摘要 |
PROBLEM TO BE SOLVED: To provide a boundary test architecture usable for executing a boundary test in an integrated circuit when the integrated circuit is in an operation mode, and especially its integrated circuit. SOLUTION: This integrated circuit is equipped with a first resistor for storing data synchronously with timing introduced from a serial scanning clock, a second register for storing data synchronously with timing introduced from a functional clock separated from the serial scanning clock, a bus of a signal lead wire connected between the first resistor and the second register in order to carry the data stored in the first resistor to the second register, and a synchronizer circuit operated in order to control the time when the second register stores the data from the first resistor. |
