发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>PURPOSE: To reduce parasitic resistance in a Zener diode for input protection, and to increase the gate insulating film protection function in the Zener diode. CONSTITUTION: An insulating film 103 in the arrangement region of the Zener diode has a plurality of groove sections 108 successively aligned in the extension direction D1 of each semiconductor region composing the diode. Each groove section 108 is extended in a width direction D2 of each semiconductor region, and has a depth T3. Each semiconductor region is provided on an upper surface 111S of the insulating film 103. As a result, each semiconductor region has a plurality of uneven shapes aligned in the extension direction D1, the Zener diode has a perimeter length not only in the horizontal direction D1 but also a vertical one D3, and pn junction area in the Zener diode is increased.</p>
申请公布号 KR20020033491(A) 申请公布日期 2002.05.07
申请号 KR20010035831 申请日期 2001.06.22
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 NARAZAKI ATSUSHI
分类号 H01L27/04;H01L21/329;H01L21/336;H01L21/822;H01L27/02;H01L29/78;H01L29/866;(IPC1-7):H01L27/04 主分类号 H01L27/04
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