摘要 |
A multi-beam exposer unit 1 includes <math-cwu id="MATH-US-00001"> <number>1</number> <math> <munderover> <mo>∑</mo> <mrow> <mi>i</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>M</mi> </munderover> </math> <mathematica-file id="MATHEMATICA-00001" file="US20020051054A1-20020502-M00001.NB"/> <image id="EMI-M00001" wi="216.027" he="24.97635" file="US20020051054A1-20020502-M00001.TIF" imf="TIFF" ti="MF"/> </math-cwu> (Ni-1) half mirror 11 for synthesizing <math-cwu id="MATH-US-00002"> <number>2</number> <math> <munderover> <mo>∑</mo> <mrow> <mi>i</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>M</mi> </munderover> </math> <mathematica-file id="MATHEMATICA-00002" file="US20020051054A1-20020502-M00002.NB"/> <image id="EMI-M00002" wi="216.027" he="24.97635" file="US20020051054A1-20020502-M00002.TIF" imf="TIFF" ti="MF"/> </math-cwu> Ni light to M groups of light beams, M sets of optical members 12, having positive power with a large absolute value as compared with a case of a main scanning direction, for further converging the beam in a sub-scanning direction, a synthesizing reflection mirror 13 for reflecting M groups of beams to be substantially overlaid on each other in a first direction, a polygon mirror unit 5 for deflecting M groups of beams, and a dust prevention glass 14 inclined to a direction opposite to a direction where the half mirror is inclined, thereby reducing influence of coma aberration exerted on M groups of beams by the half mirror.
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