发明名称 Layout instrument for semiconductor integrated circuits, layout method for semiconductor integrated circuits and recording medium that stores a program for determining layout of semiconductor integrated circuits
摘要 After a provisional layout in a sub-module of a semiconductor integrated circuit is performed, a path optimizing inter-sub-modules process is executed, and the layout and wiring among sub-modules are performed. If any part of the wiring among sub-modules does not satisfy a specified delay restriction, a provisional-layout correction process is executed to correct the provisional layout of cells in a sub-module. These processes are repeated, and then an entire layout of cells is determined.
申请公布号 US2002053067(A1) 申请公布日期 2002.05.02
申请号 US20010812848 申请日期 2001.03.21
申请人 KANAZAWA YUZI 发明人 KANAZAWA YUZI
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
代理机构 代理人
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