| 摘要 |
A multi-beam scanning apparatus includes a light source having a semiconductor laser chip in which a plurality of light emitting points are arranged such that optical beam spots are impinged at predetermined intervals in a sub-scanning direction on a surface to be scanned. A light receiving element receives a light flux from the semiconductor laser chip for monitoring the light. A case houses therein the semiconductor laser chip and the light receiving element, and has an opening for transmitting the light emitted from a surface of the semiconductor laser chip. A coupling lens couples a divergent light flux from the light source with a subsequent system. A deflector deflects the light flux. A first imaging system arranged between the coupling lens and the deflector has a power in the sub-scanning direction so as to transform the light flux from the coupling lens into a substantially linear image in a vicinity of a deflecting surface of the deflector. A second imaging system images the deflected light flux into an optical beam spot on the surface to be scanned. An intercepting member is arranged between the light source and the surface to be scanned to intercept light, which is emitted from a rear portion of the semiconductor laser chip and dispersed in the case and passes through the case opening, before reaching the surface to be scanned.
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