发明名称 Semiconductor device and its manufacturing method
摘要 A non-volatile semiconductor memory device which simultaneously possesses a non-volatile memory cell region which possesses an isolating insulation film which has been formed selectively within a semiconductor substrate, which also possesses a first electroconductive film (floating gate electrode) via a first gate insulating film which has been formed on the semiconductor substrate surface, and which also possesses a metal film (control gate electrode) via a second gate insulating film which has been formed above said electroconductive film and a peripheral transistor region which possesses a metal film (gate electrode) via a third gate insulating film which has been formed above the semiconductor substrate surface.
申请公布号 US2002043683(A1) 申请公布日期 2002.04.18
申请号 US20010964592 申请日期 2001.09.28
申请人 FUJITSU LIMITED 发明人 NAKAGAWA SHIN-ICHI;IIJIMA MITSUTERU
分类号 H01L21/28;H01L21/316;H01L21/8247;H01L27/10;H01L27/105;H01L27/115;H01L29/423;H01L29/43;H01L29/49;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L21/28
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