发明名称 METHOD AND APPARATUS FOR FORMING SEMICONDUCTOR THIN FILM
摘要 PROBLEM TO BE SOLVED: To form a semiconductor thin film having excellent homogeneity of each of a film composition structure and a film thickness. SOLUTION: A method for forming a semiconductor thin film comprises the steps of supporting a substrate M having a thin film on a surface by a support 4, providing a gas outlet 12A of a hydrogen radical oppositely to the surface of the thin film of a substrate, supplying the radical H from the outlet 12A to the thin film in a state in which the support 4 is cooled to a temperature condition lower than 40K by a thermal conduction by a refrigerator 3, and forming the thin film on the substrate M.
申请公布号 JP2002110551(A) 申请公布日期 2002.04.12
申请号 JP20000294738 申请日期 2000.09.27
申请人 YAMANASHIKEN SHOKOKAI RENGOKAI 发明人 HIRAOKA KENZO;MIYATA CHIHARU;TAKAMATSU TOSHIYUKI
分类号 H01L21/205;C23C16/452;H01L21/20;H01L21/203;H01L31/04 主分类号 H01L21/205
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