发明名称 MANUFACTURING METHOD OF MULTI-LAYER THIN FILM PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a multi-layer film pattern which can fully prevent generation of an overhang part which overhangs from an end plane of a multi-layer film pattern, as well as generation of a failure caused by that overhang in the manufacturing method of a multi-layer film including a process of patterning the multi-layer film pattern in batch using one photomask. SOLUTION: When the patterning of a multi-layer film, composed of a metal film 5 and an amorphous ITO film 4 which covers the metal film 5, is performed, a sequence of processes is executed as follows: (a) etching of the ITO film 4→(b) sufficient etching of the metal film 5→(c) etching to remove overhang part from the metal film 5 of the ITO film 4. Otherwise a sequence of processes as follows is executed: (a) etching of the ITO film 4 under a resist pattern prior to post baking→(b) extension of the resist pattern by the post baking→(c) etching of the metal film 5 under the resist pattern after the post- baking.
申请公布号 JP2002110631(A) 申请公布日期 2002.04.12
申请号 JP20000300770 申请日期 2000.09.29
申请人 TOSHIBA CORP;TOSHIBA ELECTRONIC ENGINEERING CORP 发明人 MACHIDA MASAHIKO;IMAMURA YASUYUKI;MUKAI NOBUO
分类号 H01L21/306;H01L21/027;H01L21/336;H01L29/786;(IPC1-7):H01L21/306 主分类号 H01L21/306
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