发明名称 |
MANUFACTURING METHOD OF MULTI-LAYER THIN FILM PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a multi-layer film pattern which can fully prevent generation of an overhang part which overhangs from an end plane of a multi-layer film pattern, as well as generation of a failure caused by that overhang in the manufacturing method of a multi-layer film including a process of patterning the multi-layer film pattern in batch using one photomask. SOLUTION: When the patterning of a multi-layer film, composed of a metal film 5 and an amorphous ITO film 4 which covers the metal film 5, is performed, a sequence of processes is executed as follows: (a) etching of the ITO film 4→(b) sufficient etching of the metal film 5→(c) etching to remove overhang part from the metal film 5 of the ITO film 4. Otherwise a sequence of processes as follows is executed: (a) etching of the ITO film 4 under a resist pattern prior to post baking→(b) extension of the resist pattern by the post baking→(c) etching of the metal film 5 under the resist pattern after the post- baking.
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申请公布号 |
JP2002110631(A) |
申请公布日期 |
2002.04.12 |
申请号 |
JP20000300770 |
申请日期 |
2000.09.29 |
申请人 |
TOSHIBA CORP;TOSHIBA ELECTRONIC ENGINEERING CORP |
发明人 |
MACHIDA MASAHIKO;IMAMURA YASUYUKI;MUKAI NOBUO |
分类号 |
H01L21/306;H01L21/027;H01L21/336;H01L29/786;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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